KLA Instruments Webinars

38:32

Analysis by Fast Fourier Transform: your friend for thick films

Thicker films (>8um) produce a lot of optical fringes. A quick way to sort and measure such complicated spectra is...

Posted Tuesday, August 11, 2020

03:30

Thin Film Adhesion Energy Semicon West 2020

Measuring adhesion energy of dielectric thin films with KLA Nanoindenters provides unmatched data for improving the i...

Posted Friday, July 24, 2020

57:33

波长选择，膜厚范围，和拟合度

Posted Thursday, July 16, 2020

30:50

Wavelength selection, film thickness range and goodness of fit

Let us consider the interaction of light source, spectrometer resolution, spot size, and numerical aperture of system...

Posted Tuesday, July 14, 2020

44:02

Zeta -20 在三维表面粗糙度表征中的应用

表面粗糙度表征可以通过多种表面测量技术来实现。这个网络研讨会将介绍一些测量表面粗糙度的技术，以及量化粗糙度的典型方法。此外，我们将探索如何使用3D形貌还有表面形貌和先进的量化方法来加深您对表面形貌的理解。

Posted Thursday, July 9, 2020

51:33

Session 16: How to Test Tires and Rubber Compounds

Traditional testing of laminate layers in a tire requires extensive dissection and can negatively impact the results....

Posted Wednesday, July 8, 2020

01:00:52

Session 15: Complex Modulus of Viscoelastic Polymers

Polymers are exceptionally complex materials—mechanical properties depend on chemistry, processing, and thermo-mechan...

Posted Wednesday, July 8, 2020

30:37

Dr. Warren Oliver: Nanoindentation: A Strength Microprobe

Dr. Warren Oliver provides an overview of applications in nanoindentation and examines recent research on high resolu...

Posted Monday, July 6, 2020

34:04

Film Property Measurements Using Optical Techniques (Part 2)

Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring th...

Posted Monday, July 6, 2020

40:44

Dr. Erica Lilleodden: Exploring Strength at the Nanoscale

Dr. Erica Lilleodden provides an excellent in-depth analysis of strengthening mechanisms and deformation at the nanos...

Posted Monday, June 29, 2020

28:55

Rayner Schelwald: Extracting thin film properties using optical metrology – Film thickness & topography measurements

Thin film layers control is extremely important to many technology-based industries. We will look by means of industr...

Posted Sunday, June 28, 2020

10:33

Hossein Besharatloo: Evaluation of PcBN using high-speed nanoindentation

Intrinsic hardness of each constituves phases of PcBN were evaluated. Three main hardness peaks were assessed which ...

Posted Sunday, June 28, 2020

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