KLA Instruments Webinars

26:21

Dr. Jake Polster of KLA Instruments covers the theory behind spectral reflectance measurements and shares some exampl...

Posted Wednesday, September 28, 2022

25:53

Dr. Jim Elman, Filmetrics Application Manager at KLA Instruments, discusses techniques and challenges for measuring s...

Posted Thursday, March 24, 2022

23:13

Dr. Jim Elman of Filmetrics discusses historical background of display films and how thin film metrology is an import...

Posted Wednesday, February 9, 2022

49:41

演讲嘉宾：KLA Instruments 资深应用工程师 - Marco Tsui（中文）

Posted Thursday, May 13, 2021

35:11

Posted Tuesday, May 11, 2021

37:15

Strategies and guidelines for determining and using optical constants for accurate measurement of film thickness.

Posted Tuesday, March 16, 2021

34:22

Posted Tuesday, December 8, 2020

54:49

Posted Wednesday, November 18, 2020

26:38

Posted Tuesday, September 15, 2020

56:55

超过8微米的厚膜会产生很多光干涉条纹。分析这样复杂光谱的一个简洁方法就是用快速傅里叶变换。 FILMeasure 软件包括一系列高智能方法来简化光谱分析。这包括FFT 窗口功能，波长范围自动优化，以及光学厚度滤波。我们会讲到光斑尺...

Posted Thursday, August 13, 2020

38:32

Thicker films (>8um) produce a lot of optical fringes. A quick way to sort and measure such complicated spectra is...

Posted Tuesday, August 11, 2020

57:33

Posted Thursday, July 16, 2020

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