54:15
演讲嘉宾： KLA Instruments - Jianhui Liang 博士
46:24
This webinar discusses the use of the Zeta optical profilers and Tencor stylus profilers to address metrology requirements for laser-induced surface features.
57:02
The new R50-Series Sheet Resistance measurement systems provide critical data for monitoring metal films.
37:15
Strategies and guidelines for determining and using optical constants for accurate measurement of film thickness.
59:27
Nanoindentation is a common technique for measuring the Young’s modulus and hardness of metals. With recent advancements, nanoindentation can now be used to measure the entire stress-strain curve, even within a single metal grain. Join Sr. Application Scientist Jennifer Hay for a discussion of the theory behind this new measurement, and how nanoindentation measurements of force, displacement, ...
