KLA Instruments Webinars

Name: Thin Film Metrology: Why All the Fuss over Optical Constants?
Uploaded: 2021-03-16T19:20:08-04:00
Duration: PT2235.72S
Description: Strategies and guidelines for determining and using optical constants for accurate measurement of film thickness.

Thin Film Metrology: Why All the Fuss over Optical Constants?

Tuesday, March 16, 2021

Strategies and guidelines for determining and using optical constants for accurate measurement of film thickness.

Tags: KLA Instrument webinars, Thin Films, Thin-Film Reflectometer

KLA Instruments Webinars

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Thin Film Metrology: Why All the Fuss over Optical Constants?

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