26:21
Dr. Jake Polster of KLA Instruments covers the theory behind spectral reflectance measurements and shares some examples of different thicknesses and materials that can be measured using spectral reflectance.
Posted Wednesday, September 28, 2022
25:53
Dr. Jim Elman, Filmetrics Application Manager at KLA Instruments, discusses techniques and challenges for measuring spectral reflectance on display films.
Posted Thursday, March 24, 2022
23:13
Dr. Jim Elman of Filmetrics discusses historical background of display films and how thin film metrology is an important characterization technique throughout the display manufacturing process.
Posted Wednesday, February 9, 2022
49:41
演讲嘉宾：KLA Instruments 资深应用工程师 - Marco Tsui（中文）
Posted Thursday, May 13, 2021
37:15
Strategies and guidelines for determining and using optical constants for accurate measurement of film thickness.
Posted Tuesday, March 16, 2021
54:49
Posted Wednesday, November 18, 2020
56:55
超过8微米的厚膜会产生很多光干涉条纹。 分析这样复杂光谱的一个简洁方法就是用快速傅里叶变换。 FILMeasure 软件包括一系列高智能方法来简化光谱分析。这包括FFT 窗口功能，波长范围自动优化， 以及光学厚度滤波。我们会讲到光斑尺寸的影响以及设备的选配。 还会讲到多层薄膜的应用。
Posted Thursday, August 13, 2020
38:32
Thicker films (>8um) produce a lot of optical fringes. A quick way to sort and measure such complicated spectra is to apply FFT. FILMeasure contains a suite of advanced tools to simply this analysis including: FFT Window Function, intelligent selection of wavelength range, and optical smoothing. We’ll also deal with the effects of measurement spot size and instrument selection. Multi-layered...
Posted Tuesday, August 11, 2020
57:33
Posted Thursday, July 16, 2020
