30:50
Let us consider the interaction of light source, spectrometer resolution, spot size, and numerical aperture of system optics as we attempt to measure films from angstroms to millimeters. It will be assumed for this webinar that the refractive indices are well established for the considered films. To finish off we’ll answer the very popular question: “how good does my GOF have to be?”
Posted Tuesday, July 14, 2020
34:04
Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring thick films, and measuring thin films. In this presentation, Dr. Elman explains how the measurements are made and discusses the complication of refractive indices.
Posted Monday, July 6, 2020
28:55
Thin film layers control is extremely important to many technology-based industries. We will look by means of industry examples at two principal optical measurement types; spectral reflectometry and optical profilometry. The aim is to provide you with clarity into the physical working principles, when to use these techniques, and how to apply them to a variety of samples.
Thin-film interferenc...
Posted Sunday, June 28, 2020
