KLA Instruments Webinars

Thin-Film Reflectometer Videos

• 30:50

  

  Wavelength selection, film thickness range and goodness of fit

  Let us consider the interaction of light source, spectrometer resolution, spot size, and numerical aperture of system...

  Posted Tuesday, July 14, 2020

• 34:04

  

  Film Property Measurements Using Optical Techniques (Part 2)

  Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring th...

  Posted Monday, July 6, 2020

• 28:55

  

  Rayner Schelwald: Extracting thin film properties using optical metrology – Film thickness & topography measurements

  Thin film layers control is extremely important to many technology-based industries. We will look by means of industr...

  Posted Sunday, June 28, 2020

• 33:53

  

  Film Property Measurements Using Optical Techniques (Part 1): Absolute Reflectance

  Posted Tuesday, May 12, 2020