34:04
Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring thick films, and measuring thin films. In this presentation, Dr. Elman explains how the measurements are made and discusses the complication of refractive indices.
28:55
Thin film layers control is extremely important to many technology-based industries. We will look by means of industry examples at two principal optical measurement types; spectral reflectometry and optical profilometry. The aim is to provide you with clarity into the physical working principles, when to use these techniques, and how to apply them to a variety of samples.
Thin-film interference lies at the core of optical analysis, which allows for high throughput and non-destructive measurements with no sample preparation. Filmetric’s film thickness measurement tools are based upon spectr...
01:00:57
In digital circuits, materials with low permittivity separate the conducting parts from one another; materials with lower permittivity provide better electrical and magnetic insulation. Continuous reduction in scale drives the optimization problem of lowering the permittivity of the insulator as much as possible, without compromising mechanical integrity, as quantified by the Young’s modulus. (The dielectric constant, k, is a dimensionless expression of permittivity, having been normalized by vacuum permittivity.)
This session is a live demonstration of the nanoindentation technique for m...
01:12:49
Although optical coatings are designed for the control of light (anti-reflective, reflective, splitting, filtering, etc.) it is their mechanical properties which govern longevity. Scratches at any scale lead to excessive absorption of laser energy causing localized thermal stress and ultimate failure. This session is a live demonstration of dynamic nanoindentation with the KLA iMicro nanoindenter to measure Young’s modulus and hardness of optical coatings as a continuous function of penetration depth. Ms. Hay demonstrates sample preparation, instrument configuration, test specification, exe...
