34:04
Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring thick films, and measuring thin films. In this presentation, Dr. Elman explains how the measurements are made and discusses the complication of refractive indices.
Posted Monday, July 6, 2020
28:55
Thin film layers control is extremely important to many technology-based industries. We will look by means of industry examples at two principal optical measurement types; spectral reflectometry and optical profilometry. The aim is to provide you with clarity into the physical working principles, when to use these techniques, and how to apply them to a variety of samples.
Thin-film interferenc...
Posted Sunday, June 28, 2020
01:00:57
In digital circuits, materials with low permittivity separate the conducting parts from one another; materials with lower permittivity provide better electrical and magnetic insulation. Continuous reduction in scale drives the optimization problem of lowering the permittivity of the insulator as much as possible, without compromising mechanical integrity, as quantified by the Young’s modulus. ...
Posted Wednesday, March 11, 2020
01:12:49
Although optical coatings are designed for the control of light (anti-reflective, reflective, splitting, filtering, etc.) it is their mechanical properties which govern longevity. Scratches at any scale lead to excessive absorption of laser energy causing localized thermal stress and ultimate failure. This session is a live demonstration of dynamic nanoindentation with the KLA iMicro nanoindent...
Posted Wednesday, November 27, 2019
