Instruments Webinars | Training

49:41

Spectral Reflectance with the F40 Microscope (Chinese version)

Posted Thursday, May 13, 2021

35:11

Spectral Reflectance with the F40 Microscope

Posted Tuesday, May 11, 2021

37:15

Thin Film Metrology: Why All the Fuss over Optical Constants?

Strategies and guidelines for determining and using optical constants for accurate measurement of film thickness.

Posted Tuesday, March 16, 2021

34:22

Thickness Nonuniformity (NU)_ how to manage this uninvited guest

Posted Tuesday, December 8, 2020

54:49

F54-XY-200 Webinar Video

Posted Wednesday, November 18, 2020

26:38

Reflectance and transmittance: two are better than one

Posted Tuesday, September 15, 2020

56:55

快速傅里叶变换：测厚膜时您的得力助手.mp4

超过8微米的厚膜会产生很多光干涉条纹。分析这样复杂光谱的一个简洁方法就是用快速傅里叶变换。 FILMeasure 软件包括一系列高智能方法来简化光谱分析。这包括FFT 窗口功能，波长范围自动优化，以及光学厚度滤波。我们会讲到光斑尺...

Posted Thursday, August 13, 2020

38:32

Analysis by Fast Fourier Transform: your friend for thick films

Thicker films (>8um) produce a lot of optical fringes. A quick way to sort and measure such complicated spectra is...

Posted Tuesday, August 11, 2020

57:33

波长选择，膜厚范围，和拟合度

Posted Thursday, July 16, 2020

30:50

Wavelength selection, film thickness range and goodness of fit

Let us consider the interaction of light source, spectrometer resolution, spot size, and numerical aperture of system...

Posted Tuesday, July 14, 2020

34:04

Film Property Measurements Using Optical Techniques (Part 2)

Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring th...

Posted Monday, July 6, 2020

28:55

Rayner Schelwald: Extracting thin film properties using optical metrology – Film thickness & topography measurements

Thin film layers control is extremely important to many technology-based industries. We will look by means of industr...

Posted Sunday, June 28, 2020

Instruments Webinars | Training | KLA

Thin-Film Reflectometer Videos