Instruments Webinars | Training | KLA

Thin-Film Reflectometer Videos

• 34:22

  

  Thickness Nonuniformity (NU)_ how to manage this uninvited guest

  Posted Tuesday, December 8, 2020

• 54:49

  

  F54-XY-200 Webinar Video

  Posted Wednesday, November 18, 2020

• 26:38

  

  Reflectance and transmittance: two are better than one

  Posted Tuesday, September 15, 2020

• 56:55

  

  快速傅里叶变换：测厚膜时您的得力助手.mp4

  超过8微米的厚膜会产生很多光干涉条纹。 分析这样复杂光谱的一个简洁方法就是用快速傅里叶变换。 FILMeasure 软件包括一系列高智能方法来简化光谱分析。这包括FFT 窗口功能，波长范围自动优化， 以及光学厚度滤波。我们会讲到光斑尺...

  Posted Thursday, August 13, 2020

• 38:32

  

  Analysis by Fast Fourier Transform_your friend for thick films

  Thicker films (>8um) produce a lot of optical fringes. A quick way to sort and measure such complicated spectra is...

  Posted Tuesday, August 11, 2020

• 30:50

  

  Wavelength selection, film thickness range and goodness of fit.mp4

  Let us consider the interaction of light source, spectrometer resolution, spot size, and numerical aperture of system...

  Posted Tuesday, July 14, 2020

• 34:04

  

  Film Property Measurements Using Optical Techniques (Part 2)

  Let’s bring on the thin films! Dr. Jim Elman is back to examine constraints to making good measurements, measuring th...

  Posted Monday, July 6, 2020

• 28:55

  

  Rayner Schelwald: Extracting thin film properties using optical metrology – Film thickness & topography measurements

  Thin film layers control is extremely important to many technology-based industries. We will look by means of industr...

  Posted Sunday, June 28, 2020

• 33:53

  

  Film Property Measurements Using Optical Techniques (Part 1): Absolute Reflectance

  Posted Tuesday, May 12, 2020