KLA Instruments Webinars

Defect Inspection Videos

• 44:29

  

  使用Candela®减少GaAs、InP和其他用于通信和传感应用的化合物半导体晶圆的缺陷

  使用Candela®减少GaAs、InP和其他用于通信和传感应用的化合物半导体晶圆的缺陷 (Defect Reduction on GaAs, InP and other Compound Semi Wafers for Commu...

  Posted Friday, March 18, 2022

• 51:04

  

  Defect Reduction on GaAs, InP and Other Compound Semi Wafers for Communications & Sensing Applications using Candela®

  Michael Walker of KLA Instruments discusses the benefits and capabilities of the Candela 8420 defect inspection and c...

  Posted Tuesday, February 22, 2022

• 58:55

  

  使用Candela®提升应用于功率器件、 射频器件和MicroLED的GaN晶圆缺陷良品率

  Posted Friday, May 28, 2021

• 48:48

  

  Enabling higher yield on GaN wafers for Power, RF, and MicroLED

  Posted Thursday, May 27, 2021

• 47:09

  

  zeta三维光学轮廓仪应用：自动缺陷检测、分类和三维分析

  Posted Wednesday, November 11, 2020

• 43:27

  

  Automated defect detection, mapping and characterization with the Zeta 3d optical profiler

  Posted Tuesday, November 10, 2020

• 56:53

  

  Candela助力碳化硅功率器件制造零缺陷技术路线图

  汽车应用的半导体芯片对可靠性的严格要求比其它芯片应用高很多。汽车用芯片对车辆的功能和安全至关重要，这些车规级芯片要求能可靠地工作很长一段时间。所以车规级芯片制造商一直在努力追求零缺陷标准。功率芯片在汽车系统中被大量使用，与其它车用芯片...

  Posted Wednesday, October 7, 2020

• 54:59

  

  Enabling zero defectivity roadmap for sic based power devices using candela

  The reliability requirement for semiconductor chips for automotive applications are much stringent than most other se...

  Posted Tuesday, October 6, 2020