35:52
Jennifer Hay, Senior Applications Scientist at KLA Instruments, presents an overview and demonstration of how to conduct a scratch (tribology) test on a low-k film, using the iMicro nanoindenter.
26:21
Dr. Jake Polster of KLA Instruments covers the theory behind spectral reflectance measurements and shares some examples of different thicknesses and materials that can be measured using spectral reflectance.
30:30
Walt Johnson of KLA Instruments discussed the importance of spot size and 4PP pin spacing to edge exclusion and lateral resolution.
22:19
演讲嘉宾：KLA Instruments - Frank Zhang 博士
45:14
Applications Development Engineer Warren Jolley reviews stylus force control and soft-material applications for Tencor stylus profilers.
03:30
Measuring adhesion energy of dielectric thin films with KLA Nanoindenters provides unmatched data for improving the interface bond strength. This video provides a quick introduction to measuring adhesion energy.
